Lurduma Reddy Thirumala Reddy. An Overview and Criticality of High Availability and Disaster Recovery for SAP HANA. Int. J. Sci. Res. Comput. Sci. Eng. Inf. Technol [Internet]. 2025 Feb. 3 [cited 2025 Sep. 13];11(1):1618-26. Available from: https://ijsrcseit.technoscienceacademy.com/index.php/home/article/view/CSEIT251112189